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Y. Takeyama

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2002
1EEO. Hirabayashi, A. Suzuki, T. Yabe, A. Kawasumi, Y. Takeyama, K. Kushida, A. Tohata, N. Otsuka: DFT Techniques for Wafer-Level At-Speed Testing of High-Speed SRAMs. ITC 2002: 164-169

Coauthor Index

1O. Hirabayashi [1]
2A. Kawasumi [1]
3K. Kushida [1]
4N. Otsuka [1]
5A. Suzuki [1]
6A. Tohata [1]
7T. Yabe [1]

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