| |
| 2002 | ||
|---|---|---|
| 1 | EE | O. Hirabayashi, A. Suzuki, T. Yabe, A. Kawasumi, Y. Takeyama, K. Kushida, A. Tohata, N. Otsuka: DFT Techniques for Wafer-Level At-Speed Testing of High-Speed SRAMs. ITC 2002: 164-169 |
| 1 | O. Hirabayashi | [1] |
| 2 | K. Kushida | [1] |
| 3 | N. Otsuka | [1] |
| 4 | A. Suzuki | [1] |
| 5 | Y. Takeyama | [1] |
| 6 | A. Tohata | [1] |
| 7 | T. Yabe | [1] |