2008 | ||
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4 | EE | Brian Swahn, Soha Hassoun: Electro-Thermal Analysis of Multi-Fin Devices. IEEE Trans. VLSI Syst. 16(7): 816-829 (2008) |
2006 | ||
3 | EE | Brian Swahn, Soha Hassoun: Gate sizing: finFETs vs 32nm bulk MOSFETs. DAC 2006: 528-531 |
2 | EE | Brian Swahn, Soha Hassoun: METS: A Metric for Electro-Thermal Sensitivity, and Its Application To FinFETs. ISQED 2006: 121-126 |
2003 | ||
1 | EE | Brian Swahn, Soha Hassoun: Hardware Scheduling for Dynamic Adaptability using External Profiling and Hardware Threading. ICCAD 2003: 58-65 |
1 | Soha Hassoun | [1] [2] [3] [4] |