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Brian Swahn

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2008
4EEBrian Swahn, Soha Hassoun: Electro-Thermal Analysis of Multi-Fin Devices. IEEE Trans. VLSI Syst. 16(7): 816-829 (2008)
2006
3EEBrian Swahn, Soha Hassoun: Gate sizing: finFETs vs 32nm bulk MOSFETs. DAC 2006: 528-531
2EEBrian Swahn, Soha Hassoun: METS: A Metric for Electro-Thermal Sensitivity, and Its Application To FinFETs. ISQED 2006: 121-126
2003
1EEBrian Swahn, Soha Hassoun: Hardware Scheduling for Dynamic Adaptability using External Profiling and Hardware Threading. ICCAD 2003: 58-65

Coauthor Index

1Soha Hassoun [1] [2] [3] [4]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)