| |
| 2006 | ||
|---|---|---|
| 2 | EE | Zhilin Sun, Weifeng Sun, Longxing Shi: A review of safe operation area. Microelectronics Journal 37(7): 661-667 (2006) |
| 1 | EE | Zhilin Sun, Weifeng Sun, Yangbo Yi, Longxing Shi: Study of the power capability of LDMOS and the improved methods. Microelectronics Reliability 46(5-6): 1001-1005 (2006) |
| 1 | Longxing Shi | [1] [2] |
| 2 | Weifeng Sun | [1] [2] |
| 3 | Yangbo Yi | [1] |