R. Schmitt
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1997
1
EE
R. Schmid
, R. Schmitt,
M. Brunner
,
O. Gessner
,
M. Sturm
: Electron Beam Probing - A Solution for MCM Test and Failure Analysis.
J. Electronic Testing 10
(1-2): 55-63 (1997)
Coauthor
Index
1
M. Brunner
[
1
]
2
O. Gessner
[
1
]
3
R. Schmid
[
1
]
4
M. Sturm
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
