| |
| 2002 | ||
|---|---|---|
| 1 | EE | Juin J. Liou, Qiang Zhang, John McMacken, J. Ross Thomson, Kevin Stiles, Paul Layman: Statistical modeling of MOS devices for parametric yield prediction. Microelectronics Reliability 42(4-5): 787-795 (2002) |
| 1 | Paul Layman | [1] |
| 2 | Juin J. Liou | [1] |
| 3 | John McMacken | [1] |
| 4 | J. Ross Thomson | [1] |
| 5 | Qiang Zhang | [1] |