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Nicholas J. Stessman

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1995
2EEBapiraju Vinnakota, Ramesh Harjani, Nicholas J. Stessman: System-Level Design for Test of Fully Differential Analog Circuits. DAC 1995: 450-454
1EEBapiraju Vinnakota, Nicholas J. Stessman: Reducing test application time in scan design schemes. VTS 1995: 367-373

Coauthor Index

1Ramesh Harjani [2]
2Bapiraju Vinnakota [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)