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1995 | ||
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2 | EE | Bapiraju Vinnakota, Ramesh Harjani, Nicholas J. Stessman: System-Level Design for Test of Fully Differential Analog Circuits. DAC 1995: 450-454 |
1 | EE | Bapiraju Vinnakota, Nicholas J. Stessman: Reducing test application time in scan design schemes. VTS 1995: 367-373 |
1 | Ramesh Harjani | [2] |
2 | Bapiraju Vinnakota | [1] [2] |