2006 | ||
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2 | EE | L. Peternai, J. Kovác, G. Irmer, S. Hasenöhrl, J. Novák, R. Srnánek: Investigation of graded InxGa1-xP buffer by Raman scattering method. Microelectronics Journal 37(6): 487-490 (2006) |
1 | EE | R. Kinder, A. Vincze, M. Kuruc, R. Srnánek, B. Lojek, B. Sopko, D. Chren: Investigation of the implanted phosphorus in a boron doped SiGe epitaxial layer. Microelectronics Journal 37(7): 642-645 (2006) |
1 | D. Chren | [1] |
2 | S. Hasenöhrl | [2] |
3 | G. Irmer | [2] |
4 | R. Kinder | [1] |
5 | J. Kovác | [2] |
6 | M. Kuruc | [1] |
7 | B. Lojek | [1] |
8 | J. Novák | [2] |
9 | L. Peternai | [2] |
10 | B. Sopko | [1] |
11 | A. Vincze | [1] |