1996 | ||
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4 | Philip C. Murley, G. R. Srinivasan: Soft-error Monte Carlo modeling program, SEMM. IBM Journal of Research and Development 40(1): 109-118 (1996) | |
3 | EE | James F. Ziegler, G. R. Srinivasan: Preface. IBM Journal of Research and Development 40(1): 2-2 (1996) |
2 | G. R. Srinivasan: Modeling the cosmic-ray-induced soft-error rate in integrated circuits: An overview. IBM Journal of Research and Development 40(1): 77-90 (1996) | |
1990 | ||
1 | EE | E. Rorris, R. R. O'Brien, F. F. Morehead, R. F. Lever, J. P. Peng, G. R. Srinivasan: A new approach to the simulation of the coupled point defects and impurity diffusion. IEEE Trans. on CAD of Integrated Circuits and Systems 9(10): 1113-1122 (1990) |
1 | R. F. Lever | [1] |
2 | F. F. Morehead | [1] |
3 | Philip C. Murley | [4] |
4 | R. R. O'Brien | [1] |
5 | J. P. Peng | [1] |
6 | E. Rorris | [1] |
7 | James F. Ziegler | [3] |