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| 1990 | ||
|---|---|---|
| 1 | EE | E. Rorris, R. R. O'Brien, F. F. Morehead, R. F. Lever, J. P. Peng, G. R. Srinivasan: A new approach to the simulation of the coupled point defects and impurity diffusion. IEEE Trans. on CAD of Integrated Circuits and Systems 9(10): 1113-1122 (1990) |
| 1 | R. F. Lever | [1] |
| 2 | F. F. Morehead | [1] |
| 3 | R. R. O'Brien | [1] |
| 4 | J. P. Peng | [1] |
| 5 | G. R. Srinivasan | [1] |