| |
| 2004 | ||
|---|---|---|
| 2 | EE | Jason Y. L. Goh, Mark C. Pitter, Chung W. See, Michael G. Somekh, Daniel Vanderstraeten: Sub-pixel image correlation: an alternative to SAM and dye penetrant for crack detection and mechanical stress localisation in semiconductor packages. Microelectronics Reliability 44(2): 259-267 (2004) |
| 2001 | ||
| 1 | EE | Mark C. Pitter, Chung W. See, Michael G. Somekh: Fast subpixel digital image correlation using artificial neural networks. ICIP (2) 2001: 901-904 |
| 1 | Jason Y. L. Goh | [2] |
| 2 | Mark C. Pitter | [1] [2] |
| 3 | Chung W. See | [1] [2] |
| 4 | Daniel Vanderstraeten | [2] |