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F. Sibileau

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2005
1EEF. Sibileau, C. Ali, C. Giret, D. Faure: SRAM cell defect isolation methodology by sub micron probing technique. Microelectronics Reliability 45(9-11): 1562-1567 (2005)

Coauthor Index

1C. Ali [1]
2D. Faure [1]
3C. Giret [1]

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