Amit M. Sheth

List of publications from the DBLP Bibliography Server - FAQ

2004

1 EE Amit M. Sheth, Jacob Savir: Scan Latch Design for Test Applications. J. Electronic Testing 20(2): 213-216 (2004)

2004
1	EE	Amit M. Sheth, Jacob Savir: Scan Latch Design for Test Applications. J. Electronic Testing 20(2): 213-216 (2004)

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