Philip Shephard III

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1998

1 EE Kamran Zarrineh, Shambhu J. Upadhyaya, Philip Shephard III: Automatic Insertion of Scan Structures to Enhance Testability of Embedded Memories, Cores and Chips. VTS 1998: 98-105

1998
1	EE	Kamran Zarrineh, Shambhu J. Upadhyaya, Philip Shephard III: Automatic Insertion of Scan Structures to Enhance Testability of Embedded Memories, Cores and Chips. VTS 1998: 98-105

Coauthor Index

1 Shambhu J. Upadhyaya [1]

2 Kamran Zarrineh [1]