Phil Shephard III
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2000
1
EE
R. Dean Adams
, Phil Shephard III: Silicon-on-Insulator Technology Impacts on SRAM Testing.
VTS 2000
: 43-48
Coauthor
Index
1
R. Dean Adams
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
