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| 2002 | ||
|---|---|---|
| 1 | EE | Joachim C. Reiner, Philippe Gasser, Urs Sennhauser: Novel FIB-based sample preparation technique for TEM analysis of ultra-thin gate oxide breakdown. Microelectronics Reliability 42(9-11): 1753-1757 (2002) |
| 1 | Philippe Gasser | [1] |
| 2 | Joachim C. Reiner | [1] |