C. Sebeke
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2006
1
EE
C. Sebeke,
C. Jung
,
Klaus Harbich
,
S. Fuchs
,
J. Schwarz
,
Peter Göhner
: Test and reliability challenges in automotive microelectronics.
DATE 2006
: 547
Coauthor
Index
1
S. Fuchs
[
1
]
2
Peter Göhner
[
1
]
3
Klaus Harbich
[
1
]
4
C. Jung
[
1
]
5
J. Schwarz
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
