| |
| 2005 | ||
|---|---|---|
| 1 | EE | Christian Schlünder, Ralf Brederlow, Benno Ankele, Wolfgang Gustin, Karl Goser, Roland Thewes: Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits. Microelectronics Reliability 45(1): 39-46 (2005) |
| 1 | Benno Ankele | [1] |
| 2 | Ralf Brederlow | [1] |
| 3 | Karl Goser | [1] |
| 4 | Wolfgang Gustin | [1] |
| 5 | Roland Thewes | [1] |