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Wolfgang Gustin

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2005
1EEChristian Schlünder, Ralf Brederlow, Benno Ankele, Wolfgang Gustin, Karl Goser, Roland Thewes: Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits. Microelectronics Reliability 45(1): 39-46 (2005)

Coauthor Index

1Benno Ankele [1]
2Ralf Brederlow [1]
3Karl Goser [1]
4Christian Schlünder [1]
5Roland Thewes [1]

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