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2005 | ||
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1 | EE | Christian Schlünder, Ralf Brederlow, Benno Ankele, Wolfgang Gustin, Karl Goser, Roland Thewes: Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits. Microelectronics Reliability 45(1): 39-46 (2005) |
1 | Benno Ankele | [1] |
2 | Ralf Brederlow | [1] |
3 | Karl Goser | [1] |
4 | Christian Schlünder | [1] |
5 | Roland Thewes | [1] |