C. Schippel
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2007
1
EE
F. Schwierz
, C. Schippel: Performance trends of Si-based RF transistors.
Microelectronics Reliability 47
(2-3): 384-390 (2007)
Coauthor
Index
1
F. Schwierz
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
