| |
| 2008 | ||
|---|---|---|
| 3 | EE | Jan Schat: Fault Clustering in deep-submicron CMOS Processes. DATE 2008: 511-514 |
| 2 | EE | Jan Schat: Calculating the fault coverage for dual neighboring faults using single stuck-at fault patterns. DDECS 2008: 235-240 |
| 1 | EE | Jan Schat: Evaluation of the Iddq Signature in devices with Gauss-distributed background current. DDECS 2008: 241-246 |