Rajeshwar S. Sable

2004
1	EE	Rajeshwar S. Sable, Ravindra P. Saraf, Rubin A. Parekhji, Arun N. Chandorkar: Built-in Self-test Technique for Selective Detection of Neighbourhood Pattern Sensitive Faults in Memories. VLSI Design 2004: 753-756

Coauthor Index

1	Arun N. Chandorkar	[1]
2	Rubin A. Parekhji	[1]
3	Ravindra P. Saraf	[1]