| |
| 2008 | ||
|---|---|---|
| 1 | EE | Claas Cornelius, Frank Sill, Hagen Sämrow, Jakob Salzmann, Dirk Timmermann, Diógenes Cecilio da Silva Jr.: Encountering gate oxide breakdown with shadow transistors to increase reliability. SBCCI 2008: 111-116 |
| 1 | Claas Cornelius | [1] |
| 2 | Jakob Salzmann | [1] |
| 3 | Frank Sill | [1] |
| 4 | Diógenes Cecilio da Silva Jr. | [1] |
| 5 | Dirk Timmermann | [1] |