Randall Rooney

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2001

1 Jörg E. Vollrath, Randall Rooney: Pseudo fail bit map generation for RAMs during component test and burn-in in a manufacturing environment. ITC 2001: 768-775

2001
1		Jörg E. Vollrath, Randall Rooney: Pseudo fail bit map generation for RAMs during component test and burn-in in a manufacturing environment. ITC 2001: 768-775

Coauthor Index

1 Jörg E. Vollrath [1]