| |
| 1999 | ||
|---|---|---|
| 1 | EE | J. Joseph Clement, Stefan P. Riege, Radenko Cvijetic, Carl V. Thompson: Methodology for electromigration critical threshold design rule evaluation. IEEE Trans. on CAD of Integrated Circuits and Systems 18(5): 576-581 (1999) |
| 1 | J. Joseph Clement | [1] |
| 2 | Radenko Cvijetic | [1] |
| 3 | Carl V. Thompson | [1] |