| |
| 2006 | ||
|---|---|---|
| 1 | EE | Stephen Ridout, Milos Dusek, Chris Bailey, Chris Hunt: Assessing the performance of crack detection tests for solder joints. Microelectronics Reliability 46(12): 2122-2130 (2006) |
| 1 | Chris Bailey (Christopher Bailey) | [1] |
| 2 | Milos Dusek | [1] |
| 3 | Chris Hunt | [1] |