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2006 | ||
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1 | EE | Stephen Ridout, Milos Dusek, Chris Bailey, Chris Hunt: Assessing the performance of crack detection tests for solder joints. Microelectronics Reliability 46(12): 2122-2130 (2006) |
1 | Chris Bailey (Christopher Bailey) | [1] |
2 | Milos Dusek | [1] |
3 | Stephen Ridout | [1] |