|  |  | 
| 2005 | ||
|---|---|---|
| 1 | EE | Isaline Richard, Romain Fayolle, Jean-Claude Lecomte: New experimental approach for failure prediction in electronics: Topography and deformation measurement complemented with acoustic microscopy. Microelectronics Reliability 45(9-11): 1645-1651 (2005) | 
| 1 | Romain Fayolle | [1] | 
| 2 | Jean-Claude Lecomte | [1] |