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2005 | ||
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1 | EE | Isaline Richard, Romain Fayolle, Jean-Claude Lecomte: New experimental approach for failure prediction in electronics: Topography and deformation measurement complemented with acoustic microscopy. Microelectronics Reliability 45(9-11): 1645-1651 (2005) |
1 | Jean-Claude Lecomte | [1] |
2 | Isaline Richard | [1] |