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Gilbert B. Rayner

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2001
1EEGerald Lucovsky, Gilbert B. Rayner, Robert S. Johnson: Chemical and physical limits on the performance of metal silicate high-k gate dielectrics. Microelectronics Reliability 41(7): 937-945 (2001)

Coauthor Index

1Robert S. Johnson [1]
2Gerald Lucovsky [1]

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