| |
| 2007 | ||
|---|---|---|
| 2 | EE | Lan Rao, Michael L. Bushnell, Vishwani D. Agrawal: Graphical IDDQ Signatures Reduce Defect Level and Yield Loss. IEEE Trans. VLSI Syst. 15(11): 1245-1255 (2007) |
| 2003 | ||
| 1 | EE | Lan Rao, Michael L. Bushnell, Vishwani D. Agrawal: New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss. VLSI Design 2003: 353-360 |
| 1 | Vishwani D. Agrawal | [1] [2] |
| 2 | Michael L. Bushnell | [1] [2] |