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Lan Rao

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2007
2EELan Rao, Michael L. Bushnell, Vishwani D. Agrawal: Graphical IDDQ Signatures Reduce Defect Level and Yield Loss. IEEE Trans. VLSI Syst. 15(11): 1245-1255 (2007)
2003
1EELan Rao, Michael L. Bushnell, Vishwani D. Agrawal: New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss. VLSI Design 2003: 353-360

Coauthor Index

1Vishwani D. Agrawal [1] [2]
2Michael L. Bushnell [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)