| |
| 2004 | ||
|---|---|---|
| 1 | EE | Simone Lee, Ramesh Ramadoss, Michael Buck, V. M. Bright, K. C. Gupta, Y. C. Lee: Reliability testing of flexible printed circuit-based RF MEMS capacitive switches. Microelectronics Reliability 44(2): 245-250 (2004) |
| 1 | V. M. Bright | [1] |
| 2 | Michael Buck | [1] |
| 3 | K. C. Gupta | [1] |
| 4 | Simone Lee | [1] |
| 5 | Y. C. Lee | [1] |