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V. M. Bright

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2004
1EESimone Lee, Ramesh Ramadoss, Michael Buck, V. M. Bright, K. C. Gupta, Y. C. Lee: Reliability testing of flexible printed circuit-based RF MEMS capacitive switches. Microelectronics Reliability 44(2): 245-250 (2004)

Coauthor Index

1Michael Buck [1]
2K. C. Gupta [1]
3Simone Lee [1]
4Y. C. Lee [1]
5Ramesh Ramadoss [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)