| 2005 |
|---|
| 11 | EE | Nema Dean,
Adrian E. Raftery:
Normal uniform mixture differential gene expression detection for cDNA microarrays.
BMC Bioinformatics 6: 173 (2005) |
| 10 | EE | Ka Yee Yeung,
Roger Eugene Bumgarner,
Adrian E. Raftery:
Bayesian model averaging: development of an improved multi-class, gene selection and classification tool for microarray data.
Bioinformatics 21(10): 2394-2402 (2005) |
| 9 | EE | Qunhua Li,
Chris Fraley,
Roger Eugene Bumgarner,
Ka Yee Yeung,
Adrian E. Raftery:
Donuts, scratches and blanks: robust model-based segmentation of microarray images.
Bioinformatics 21(12): 2875-2882 (2005) |
| 8 | EE | Fionn Murtagh,
Adrian E. Raftery,
Jean-Luc Starck:
Bayesian inference for multiband image segmentation via model-based cluster trees.
Image Vision Comput. 23(6): 587-596 (2005) |
| 2002 |
|---|
| 7 | EE | Derek C. Stanford,
Adrian E. Raftery:
Approximate Bayes Factors for Image Segmentation: The Pseudolikelihood Information Criterion (PLIC).
IEEE Trans. Pattern Anal. Mach. Intell. 24(11): 1517-1520 (2002) |
| 6 | EE | Daniel Walsh,
Adrian E. Raftery:
Accurate and efficient curve detection in images: the importance sampling Hough transform.
Pattern Recognition 35(7): 1421-1431 (2002) |
| 2001 |
|---|
| 5 | | Ka Yee Yeung,
Chris Fraley,
A. Murua,
Adrian E. Raftery,
Walter L. Ruzzo:
Model-based clustering and data transformations for gene expression data.
Bioinformatics 17(10): 977-987 (2001) |
| 2000 |
|---|
| 4 | EE | Derek C. Stanford,
Adrian E. Raftery:
Finding Curvilinear Features in Spatial Point Patterns: Principal Curve Clustering with Noise.
IEEE Trans. Pattern Anal. Mach. Intell. 22(6): 601-609 (2000) |
| 1998 |
|---|
| 3 | | Chris Fraley,
Adrian E. Raftery:
How Many Clusters? Which Clustering Method? Answers Via Model-Based Cluster Analysis.
Comput. J. 41(8): 578-588 (1998) |
| 1997 |
|---|
| 2 | EE | J. G. Campbell,
Chris Fraley,
Fionn Murtagh,
Adrian E. Raftery:
Linear flaw detection in woven textiles using model-based clustering.
Pattern Recognition Letters 18(14): 1539-1548 (1997) |
| 1984 |
|---|
| 1 | EE | Fionn Murtagh,
Adrian E. Raftery:
Fitting straight lines to point patterns.
Pattern Recognition 17(5): 479-483 (1984) |
