Stefan Radtke
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1995
1
EE
Stefan Radtke,
Jens Bargfrede
,
Walter Anheier
: Distributed automatic test pattern generation with a parallel FAN algorithm.
ICCD 1995
: 698-
Coauthor
Index
1
Walter Anheier
[
1
]
2
Jens Bargfrede
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)