J. C. Phillips

List of publications from the DBLP Bibliography Server - FAQ

2005

1 EE Gerald Lucovsky, J. C. Phillips: Bond strain and defects at interfaces in high-k gate stacks. Microelectronics Reliability 45(5-6): 770-778 (2005)

2005
1	EE	Gerald Lucovsky, J. C. Phillips: Bond strain and defects at interfaces in high-k gate stacks. Microelectronics Reliability 45(5-6): 770-778 (2005)

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