| |
| 2006 | ||
|---|---|---|
| 2 | EE | Young-Ho Woo, Do-Hyun Nam, Tai-sung Hur, Young-Bae Park, Woong Huh, Yoseop Woo, Hongki Min: Automated Keyword Extraction Using Category Correlation of Data. ICCSA (2) 2006: 224-230 |
| 2004 | ||
| 1 | EE | Insu Jeon, Young-Bae Park: Analysis of the reservoir effect on electromigration reliability. Microelectronics Reliability 44(6): 917-928 (2004) |
| 1 | Woong Huh | [2] |
| 2 | Tai-sung Hur | [2] |
| 3 | Insu Jeon | [1] |
| 4 | Hongki Min | [2] |
| 5 | Do-Hyun Nam | [2] |
| 6 | Yoseop Woo | [2] |
| 7 | Young-Ho Woo | [2] |