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2002 | ||
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2 | EE | Amit R. Pandey, Janak H. Patel: An Incremental Algorithm for Test Generation in Illinois Scan Architecture Based Designs. DATE 2002: 368-375 |
1 | EE | Amit R. Pandey, Janak H. Patel: Reconfiguration Technique for Reducing Test Time and Test Data Volume in Illinois Scan Architecture Based Designs . VTS 2002: 9-15 |
1 | Janak H. Patel | [1] [2] |