| 2007 |
|---|
| 3 | EE | Federico Di Palma,
Giuseppe De Nicolao,
Guido Miraglia,
Oliver M. Donzelli:
ACID: Automatic Sort-Map Classification for Interactive Process Diagnosis.
IEEE Design & Test of Computers 24(4): 352-361 (2007) |
| 2005 |
|---|
| 2 | EE | Federico Di Palma,
Giuseppe De Nicolao,
Guido Miraglia,
Oliver M. Donzelli:
Process Diagnosis via Electrical-Wafer-Sorting Maps Classification.
ICDM 2005: 601-604 |
| 1 | EE | Federico Di Palma,
Giuseppe De Nicolao,
Guido Miraglia,
Egidio Pasquinetti,
Francesco Piccinini:
Unsupervised spatial pattern classification of electrical-wafer-sorting maps in semiconductor manufacturing.
Pattern Recognition Letters 26(12): 1857-1865 (2005) |
