| |
| 2005 | ||
|---|---|---|
| 1 | EE | Federico Di Palma, Giuseppe De Nicolao, Guido Miraglia, Egidio Pasquinetti, Francesco Piccinini: Unsupervised spatial pattern classification of electrical-wafer-sorting maps in semiconductor manufacturing. Pattern Recognition Letters 26(12): 1857-1865 (2005) |
| 1 | Guido Miraglia | [1] |
| 2 | Giuseppe De Nicolao | [1] |
| 3 | Federico Di Palma | [1] |
| 4 | Egidio Pasquinetti | [1] |