| |
| 2006 | ||
|---|---|---|
| 1 | EE | M. Agostinelli, S. Lau, S. Pae, P. Marzolf, H. Muthali, S. Jacobs: PMOS NBTI-induced circuit mismatch in advanced technologies. Microelectronics Reliability 46(1): 63-68 (2006) |
| 1 | M. Agostinelli | [1] |
| 2 | S. Jacobs | [1] |
| 3 | S. Lau | [1] |
| 4 | P. Marzolf | [1] |
| 5 | H. Muthali | [1] |