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P. Marzolf

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2006
1EEM. Agostinelli, S. Lau, S. Pae, P. Marzolf, H. Muthali, S. Jacobs: PMOS NBTI-induced circuit mismatch in advanced technologies. Microelectronics Reliability 46(1): 63-68 (2006)

Coauthor Index

1M. Agostinelli [1]
2S. Jacobs [1]
3S. Lau [1]
4H. Muthali [1]
5S. Pae [1]

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