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Michael Pabst

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1994
2EEKarl Fuchs, Michael Pabst, Torsten Rössel: RESIST: a recursive test pattern generation algorithm for path delay faults. EURO-DAC 1994: 316-321
1EEKarl Fuchs, Michael Pabst, Torsten Rössel: RESIST: a recursive test pattern generation algorithm for path delay faults considering various test classes. IEEE Trans. on CAD of Integrated Circuits and Systems 13(12): 1550-1562 (1994)

Coauthor Index

1Karl Fuchs [1] [2]
2Torsten Rössel [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)