1994 | ||
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2 | EE | Karl Fuchs, Michael Pabst, Torsten Rössel: RESIST: a recursive test pattern generation algorithm for path delay faults. EURO-DAC 1994: 316-321 |
1 | EE | Karl Fuchs, Michael Pabst, Torsten Rössel: RESIST: a recursive test pattern generation algorithm for path delay faults considering various test classes. IEEE Trans. on CAD of Integrated Circuits and Systems 13(12): 1550-1562 (1994) |
1 | Karl Fuchs | [1] [2] |
2 | Torsten Rössel | [1] [2] |