| |
| 2005 | ||
|---|---|---|
| 1 | EE | D. Q. Kelly, S. Dey, D. Onsongo, S. K. Banerjee: Considerations for evaluating hot-electron reliability of strained Si n-channel MOSFETs. Microelectronics Reliability 45(7-8): 1033-1040 (2005) |
| 1 | S. K. Banerjee | [1] |
| 2 | S. Dey | [1] |
| 3 | D. Q. Kelly | [1] |