D. Q. Kelly

List of publications from the DBLP Bibliography Server - FAQ

2005

1 EE D. Q. Kelly, S. Dey, D. Onsongo, S. K. Banerjee: Considerations for evaluating hot-electron reliability of strained Si n-channel MOSFETs. Microelectronics Reliability 45(7-8): 1033-1040 (2005)

2005
1	EE	D. Q. Kelly, S. Dey, D. Onsongo, S. K. Banerjee: Considerations for evaluating hot-electron reliability of strained Si n-channel MOSFETs. Microelectronics Reliability 45(7-8): 1033-1040 (2005)

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