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D. Q. Kelly

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2005
1EED. Q. Kelly, S. Dey, D. Onsongo, S. K. Banerjee: Considerations for evaluating hot-electron reliability of strained Si n-channel MOSFETs. Microelectronics Reliability 45(7-8): 1033-1040 (2005)

Coauthor Index

1S. K. Banerjee [1]
2S. Dey [1]
3D. Onsongo [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)