| 2005 |
|---|
| 5 | EE | Beatriz Olleta,
Hanjun Jiang,
Degang Chen,
Randall L. Geiger:
A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test.
ISCAS (1) 2005: 784-787 |
| 2004 |
|---|
| 4 | EE | Beatriz Olleta,
Hanjun Jiang,
Degang Chen,
Randall L. Geiger:
Testing high resolution ADCs using deterministic dynamic element matching.
ISCAS (1) 2004: 920-923 |
| 3 | EE | Beatriz Olleta,
Hanjun Jiang,
Degang Chen,
Randall L. Geiger:
Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing.
ISCAS (1) 2004: 924-927 |
| 2 | EE | Hanjun Jiang,
Beatriz Olleta,
Degang Chen,
Randall L. Geiger:
Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs.
ITC 2004: 1379-1388 |
| 2003 |
|---|
| 1 | EE | Beatriz Olleta,
Lance Juffer,
Degang Chen,
Randall L. Geiger:
A deterministic dynamic element matching approach to ADC testing.
ISCAS (5) 2003: 533-536 |
