2005 |
3 | EE | H. Aono,
E. Murakami,
K. Okuyama,
A. Nishida,
M. Minami,
Y. Ooji,
K. Kubota:
Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime.
Microelectronics Reliability 45(7-8): 1109-1114 (2005) |
2002 |
2 | EE | K. Konishi,
K. Okuyama,
A. Kato,
T. Furukawa:
Design method for optimal step size matrix of the affine projection algorithm using semidefinite programming.
ISCAS (3) 2002: 41-44 |
1 | EE | K. Okuyama,
S. Yoshimoto,
T. Furukawa:
New adaptive Kalman filters using filter bank.
ISCAS (3) 2002: 49-52 |