A. Nishida

2005
1	EE	H. Aono, E. Murakami, K. Okuyama, A. Nishida, M. Minami, Y. Ooji, K. Kubota: Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime. Microelectronics Reliability 45(7-8): 1109-1114 (2005)

Coauthor Index

1	H. Aono	[1]
2	K. Kubota	[1]
3	M. Minami	[1]
4	E. Murakami	[1]
5	K. Okuyama	[1]
6	Y. Ooji	[1]