T. Ogihara

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1989

2 EE T. Ogihara, K. Muroi, G. Yonemori, S. Murai: MULTES/IS: An Effective and Reliable Test Generation System for Partial Scan and Non-Scan Synchronous Circuits. DAC 1989: 519-524

1987

1 EE T. Ogihara, H. Toyoshima, S. Murai: ASTA: LSI Design Management System. DAC 1987: 530-536

1989
2	EE	T. Ogihara, K. Muroi, G. Yonemori, S. Murai: MULTES/IS: An Effective and Reliable Test Generation System for Partial Scan and Non-Scan Synchronous Circuits. DAC 1989: 519-524
1987
1	EE	T. Ogihara, H. Toyoshima, S. Murai: ASTA: LSI Design Management System. DAC 1987: 530-536

Coauthor Index

1 S. Murai [1] [2]

2 K. Muroi [2]

3 H. Toyoshima [1]

4 G. Yonemori [2]