K. Muroi

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1989

1 EE T. Ogihara, K. Muroi, G. Yonemori, S. Murai: MULTES/IS: An Effective and Reliable Test Generation System for Partial Scan and Non-Scan Synchronous Circuits. DAC 1989: 519-524

1989
1	EE	T. Ogihara, K. Muroi, G. Yonemori, S. Murai: MULTES/IS: An Effective and Reliable Test Generation System for Partial Scan and Non-Scan Synchronous Circuits. DAC 1989: 519-524

Coauthor Index

1 S. Murai [1]

2 T. Ogihara [1]

3 G. Yonemori [1]